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Electron beam
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#	Item
571	From Design to Part MAY[removed]VOLUME 60 / ISSUE 5 By Alan Richter, Editor Add to Reading List Source URL: www.ctemag.com Language: English - Date: 2008-05-05 01:00:00 Metalworking Manufacturing Direct metal laser sintering Selective laser sintering Electron beam melting Rapid prototyping Additive manufacturing 3D printing 3D Systems Solid freeform fabrication Technology Business
572	http://oac.cdlib.org/findaid/ark:/13030/kt8n39q77p No online items Finding Aid for the Carlos G. Velez-Ibanez Sterilization Papers ca[removed]Processed by CSRC. Chicano Studies Research Center, UCLA Add to Reading List Source URL: pdf.oac.cdlib.org Language: English - Date: 2014-10-05 18:38:29 Hygiene Microbiology Sterilization Finding aid Ibanez Folder Compulsory sterilization Health Biology Archival science Eugenics Electron beam
573	SEM Use Authorization As of __/__/____, _________________, has demonstrated that he/she is capable of correctly and safely completing the following tasks associated with the UW-Stout SEM: The user is able to correctly s Add to Reading List Source URL: www.uwstout.edu Language: English - Date: 2011-10-28 14:48:34 Microscopes Electron beam Scientific method Electron microscopy Science
574	Monday Scientific Program August 5 Add to Reading List Source URL: microscopy.org Language: English - Date: 2013-07-02 18:35:26 Science Electron beam Chemistry Laboratory techniques Electron microscope Photoemission electron microscopy Transmission electron microscopy Scanning transmission electron microscopy Tomography Scientific method Electron microscopy Microscopes
575	Scintillator-based ion beam profiler for diagnosing laser-accelerated ion beams J. S. Greena, M. Borghesib, C. M. Brennera,c, D. C. Carrollc, N. P. Doverd, P. S. Fostera,b, P. Gallegosa,c, S. Greenf, D. Kirbye, K.J. Kir Add to Reading List Source URL: epubs.surrey.ac.uk Language: English* - Date: 2013-09-23 14:52:03 Medical physics Particle physics Particle detectors Scintillator Ion source Laser Bragg peak Proton therapy Electron Physics Nuclear physics Radiation oncology
576 $Optics / X-ray microscope / Diffraction / Extreme ultraviolet lithography / X-ray / Electron / Diffraction topography / Physics / Electromagnetic radiation / Microscopes$	Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling Add to Reading List Source URL: journals.iucr.org Language: English - Date: 2014-04-23 12:28:22 Optics X-ray microscope Diffraction Extreme ultraviolet lithography X-ray Electron Diffraction topography Physics Electromagnetic radiation Microscopes
577	Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile) Add to Reading List Source URL: www.izm.fraunhofer.de Language: English - Date: 2015-02-12 09:57:08 Reliability Measuring instrument Thermomechanical analysis Failure analysis Electron microscope Dynamic mechanical analysis Atomic force microscopy Characterization MIL-STD-883 Science Materials science Scientific method
578	Program ended in FY 2004 ●Basic Stage Nanotech Materials Add to Reading List Source URL: www.mext.go.jp Language: English - Date: 2008-12-04 01:44:54 Manufacturing Nanomaterials Microtechnology Carbides Silicon carbide Nanoimprint lithography Electron beam lithography Nanofiber Nanoparticle Materials science Chemistry Nanotechnology
579	PRISM Seminar Series – Fall 2012 “Dynamic In-Situ Transmission Electron Microscopy to Meet the Challenges of the Nanoworld” Volkan Ortalan School of Materials Engineering Add to Reading List Source URL: www.purdue.edu Language: English Microscopes Microbiology Electron beam Laboratory techniques Transmission electron microscopy Microscopy Electron microscope Scanning transmission electron microscopy Materials science Electron microscopy Scientific method Science
580 $Scientific method / Emerging technologies / Electron beam / Microscopes / Diffraction / Carbon nanotube / Transmission electron microscopy / Electron microscope / Electron diffraction / Physics / Chemistry / Electron microscopy$	TECHNICAL COMMENTS Comment on “Single Crystals of Single-Walled Carbon Nanotubes Formed by Self-Assembly” Schlittler et al. (1) reported the production of single crystals of single-walled carbon nanotubes (SWCNTs) by Add to Reading List Source URL: www.ece.rice.edu Language: English - Date: 2004-01-18 12:56:00 Scientific method Emerging technologies Electron beam Microscopes Diffraction Carbon nanotube Transmission electron microscopy Electron microscope Electron diffraction Physics Chemistry Electron microscopy

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